Deskripsi
· X-ray inspection system that facilitates real-time imaging and defect analysis of next-generation wafer-level, semiconductor device and PCBA applications
· Large measurement area
· Intuitive joystick navigation drives real-time X-ray imaging
· Safety as a design criterion
· specifically designed for x-ray inspection in production lines and failure
Lihat detail lebih lanjut tentang Atomic Solutions Sdn Bhd
Malaysia
