KEYSIGHT NX5402A Silicon Photonics Wafer Test System

Product Details

NX5402A Silicon Photonics Wafer Test System is a solution of Keysight NX5400 Silicon Photonics Test Solution Series. It provides all required features for volume production testing such as Wafer Acceptance Testing (WAT) or Process Control Monitoring (PCM) with a fully automated wafer prober for volume production.

• One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
• Automated one pass testing for complex and massive optical and electrical measurements
• Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
• High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
• Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
• Dedicated support model enabling high system availability for production
• Keysight-developed Fiber Alignment and Positioning System
• Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
• Reliable performance monitoring by Build-in Automatic System Diagnostics
• Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode