Deskripsi
        Description
Applications
	- Locating wafers
 
	- Checking wafer 
 
	- Detecting busbars
 
255 jobs with 255 detectors each
	- Alignment x/y and orientation
 
	- Pattern matching / Contour: Teach- in and recognition of patterns and contours
 
	- Calliper: Measurement of the distance between edges
 
	- BLOB, Grey threshold, Brightness: Brightness analysis
 
	- Contrast: Contrast analysis
 
	- Wafer: Locate and check wafers/cells
 
	- Busbar: Locate and check busbars
 
	- Result processing Math: Process and evaluate detector results
 
This article has only a reduced number of outputs available due to component availability [pin 4 (ready), pin 9 (ext. illumination/result), pin 12 (ejector)].
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