Skyray - Thick8000 XRF Spectrometer

Skyray - Thick8000 XRF Spectrometer

Kategori: X-Ray Fluorescence (XRF) Spectrometer Tersedia
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Deskripsi

Thick 8000 Plating Thickness X-Ray Fluorescence Spectrometer is specifically designed plating thickness measurement.Skyray Microspot technology utilises a 3D movable platform, two HD cameras and 8 automatic collimators to achieve precise analysis with spot size as small as 0.1 mm.

Features
Application Fields
Technical Specifications

Measurable elements: Sulfur ( S ) - Uranium ( U )
Plating Thickness up to 20um
Repeatability: 0.1%
Stability: 0.1%
Energy Resolution 135eV
Power: AC 220V ± 5V or AC 110V ± 5V. AC purified voltage power supply
Sample chamber size: 52cm x 40cm x 15cm
Size: 69cm x 57cm x 66cm
Work Temperature: 15℃ -30 ℃

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Obsnap Instruments Sdn Bhd
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