HIOKI 9666 Test Probe (100:1) for Memory HiCorders

MOBICON-REMOTE ELECTRONIC SDN BHD

Category: HIOKI Available

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Description

Product Details

Test Probe (100:1) for Memory HiCorders

9666 Test Probe (100:1)
For Hioki Memory HiCorders with BNC inputs.
Input capacitance to the probe can be lowered to reduce the load effect

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MOBICON-REMOTE ELECTRONIC SDN BHD Electronic Components Selangor, Penang, Test & Measurement Instruments Supply Kuala Lumpur (KL), Automation Parts Supplier Malaysia ~ MOBICON-REMOTE ELECTRONIC SDN BHD

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