KEYSIGHT N4345A nanoVTEP Spring probes, Pack of 100

Product Details

Spring probes are used in conjunction with sensor plates larger than 10mm for better contact.

• Max node count: 2592
• Max channel count: 576
• Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
• Max no. of modules: 2

Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.

• Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
• 100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
• Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
• Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
• Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
• Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.

Key Features & Specifications

Quantity of 100 spring probes