Mahr Metrology - XC 2 MarWin MIT CD 120

分类: Surface Texture Measuring Instruments - Stationary Surface Measurement Devices, Computer-Based 当前有货
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Your entry into precision contour measurement

Technical Data
Resolution
In Z, relative to stylus tip: 0.38 µm (350 mm probe arm) / 0.19 µm (175 mm probe arm)
In Z, relative to measuring system: 0.04 µm
Sampling angle
On smooth surfaces, depending on deflection: trailing edges up to 88°, leading edges up to 77°
Start of traversing length (in X)
0.2 mm
Tip radius
25 µm
Contacting speed (in Z)
0.1 to 1 mm/s
Probe arm length
175 mm, 350 mm
End of traversing length (in X)
120 mm
Positioning speed
In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s
Guide deviation
< 1 µm (over 120 mm)
Measuring speed
0.2 mm/s to 4 mm/s
Measuring range mm
(in Z) 50 mm
Traversing lengths
0.2 mm to 120 mm
Measuring force (N)
1 mN to 120 mN


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