Dimensions:210×160×51mm
Language:English/Chinese/Spanish
Probe socket:LEMO or BNC
Product Introduction
TIME1150 Ultrasonic Flaw Detector is a portable, industrial, non-destructive ultrasonic flaw detector, which confirms to EN12668-1 standard, and used to rapidly, and easily inspect work pieces accurately for various defects such as cracks, inclusions and pinhole porosity etc. Further evaluation of these defects can be performed during the testing process. The instrument can be used extensively in many varying fields where materials inspection is required to maintain quality control during manufacturing and production processes, e.g. manufacturing industries, iron & steel industry, metallurgical industry, metalworking, chemical industry, etc. Ultrasonic flaw detectors are also used extensively in the active safety inspection and service-life evaluation of components in such fields as aerospace, railway transportation and boiler pressure vessels, etc.
Features
Display:
•5.7 inch, VGA color TFT LCD display screen;
•Simultaneous display A-scan and B-scan waveform;
•Five different measured values are displayed at the same time;
•Function such as freeze waveform, peak value, comparative and envelope are available.
•Various colors can be selected and brightness adjustable to meet different environment requirements.
•Language: Chinese, English and Spanish
Transmission:
•With high performance square wave pulse generator which is adjustable.
•Pulse amplitude (V):100-400, 10V step adjustable;
•Pulse width (ns):75,100-500, 50ns step adjustable;
•Impedance (Ω): 50,100,200,500 adjustable;
•Pulse repetition frequency (Hz): 10 ~ 1000;
•Working mode: single crystal probe, double crystal probe, transmission.
Receiver:
•Sampling frequency: 80MHz;
•Rectify mode: positive half wave, negative half wave, full wave, RF;
•Gain:110dB;
•Gain step: 0.1, 0.2, 0.5, 1.0, 2.0, 6.0, 12.0 dB;
•Automatic Gain;
Gate:
•Two independent measurement gates;
•Dual gate operation and measuring;
•Various gate measurements and alarm functions;
Alarm:
•Variety of alarm modes can be selected in sound alarm or light alarm;
•Gate positive wave alarm, gate negative wave alarm
Data Storage:
•With functions of save, copy or load the inspection parameters and 50 channels can be stored.
•Remarks can be added to facilitate identify channels.
•Can store or review the waves of A scan and B scan, 1000 waves can be stored.
•Active Record: store or replay waveform in real time and the waveform is 4×2000 pixel.
•Edit the parameters and displayed with the waveform.
•Thickness storage and review
Detection function:
•Standard dynamic DAC curve.
•Dynamic AVG curve.
•Two independent gates with various measuring functions.
•Peak value detection: detect the highest wave in real time and record the maximum value of the flaws.
•Flaw location: horizontal location, depth location and beam path location.
•Flaw sizing: AWS D1.1, DAC SL, AVG etc.
•Measuring probe frequency.
•Two point calibration and angle beam calibration.
•Measuring the height of crack..
•With linear reject function, the highest rejection is 80% of the full screen height.
•Calculate φ value: during inspecting the forging workpiece by using straight beam probe, the instrument will identify the highest wave of defects and then calculate φ value automatically.
•Curvate surface correction and Leg display function
Communication and printing:
•Printing inspection report by connecting printer via USB interface
•Support PCL5 and PCL6 printing language and achieve True type front printing.
•Flash disk can be connected to save the parameters and waves.
•Communicate with PC and transfer the parameters, waveforms, Screen and files to PC via USB cable.
Download to PC
Interface:
•USB OTG interface.
•Power adapter interface.
Others:
•Lock/unlock system parameters.
•With clock display.
Technical Specification
TIME1150 Technical Specification | |
Weight(kg) | Around 1.2 |
Dimensions(mm) | 210×160×51 |
Operating temperature | -10℃~+50℃ |
Storage temperature | -20℃~+60℃ |
Language | English/Chinese/Spanish selectable |
Probe socket | LEMO or BNC |
Battery(mAh) | 2×3.7V 5000mAh |
Battery working time | >8 h |
Charging time(h) | <8 h |
Power adapter Input: | 100-240~50/60Hz |
Output: | 9V DC/3 A~4A |
LCD | Color transmission TFT,640×480 |
Measuring unit | mm、inch、µs |
Scanning range(mm) | 0~10000 |
Sound velocity(m/s) | 600~16000 |
P-Delay(µs) | -1.000~750.000 |
D-Delay(µs) | -20~+3400 |
Test mode | Pulse-echo, dual and through transmission |
Scanning mode |
A scan and B scan, displaying A scan and B scan simultaneously |
Pulse Generator | |
Pulser(V) | Square pulse |
Transmitting voltage | 100-400(V)variable in steps of 10V |
Transmitting pulse width(ns) | 75 、100~500 variable in steps of 50 ns |
Damping(Ω) | 50、100、200、500 |
Pulse repetition frequency (Hz) | 10~1000 |
Receiver | |
Gain(dB) | 0~110 |
Bandwidth(MHz) | 0.5~15 |
Rectify |
Positive half way, negative half way, full and RF |
Vertical linearity error | ±2% |
Amplifier resolution (dB) | ±1 |
Reject(%) | Linear, 0~80% of the full screen |
Sampling frequency(MHz) | 80 |
Crosstalk rejection(dB) | ≥ 80 |
Dead zone(μs) | ≤10 (related with transmitting) |
Dynamic range(dB) | ≥40 |
Instant resolution(dB) | ≥32 |
Time base linearity | <±0.2% full screen |
Sensitivity leavings | ≥62dB |
Measurements and others | |
Gate | 2 independence gates |
Testing position | Edge, Peak value |
Gate measurements |
Echo amplitude、Sound path、 depth、projection etc. |
Freeze | Freeze waveform, peak value, comparative and envelope |
AVG equivalent calculate | Calculate the flaw equivalent according to the flaw echo and AVG curve |
DAC flaw evaluating |
Make flaw evaluation according to flaw echo and DAC curve |
Gate Logic | Off , measurement, gate positive wave alarm, gate negative wave alarm |
Gate alarm |
Off、anytime、hold for 0.2s、0.5s、 1s and 2s、lock |
Alarm | On/off |
Data management, communication and print | |
Data storage Data management | 50 channels |
1000 wave images (including 980 A scan images and 20 B scan images) |
|
4x2000 dynamic wave image | |
Store, review or replay the channels, waves |
|
All the data can be stored to PC or flash disk |
|
Communication |
Communicate with PC via USB interface |
Printing | Print report |
Output port | |
USB OTG port |
USB2.0 Device connected with PC USB2.0 Host connected with flash disk or printer |
Power adapter port |
Standard Delivery List
Item | Quantity |
Main unit | 1 set |
Lithium battery | 2 packs |
Power adapter (3A/9V) |
1 piece |
LEMO-Q9 Probe connecting cable(Q9-Q9 probe connecting cable) | 1 piece |
LEMO-Q6 Probe connecting cable(Q9-Q6 probe connecting cable) | 1 piece |
Carrying case | 1 piece |
Necklace belt | 1 piece |
Wrist belt | 1 piece |
Instruction manual | 1 piece |
Straight beam probe(φ20 2.5MHz) | 1 piece |
Angle beam probe(φ20 2.5MHz) | 1 piece |
Coupling agent | 1 bottle |
TIME certificate | 1 piece |
Instruction manual | 1 piece |
Optional Accessory List
Items | Quantity |
USB communication cable Host | 1 |
USB communication cable Device | 1 |
Flash Disk | 1 |
Software | 1 |
Printer | 1 |
Standard probe | 1 |
Lithium battery | 1 |
Standard Test Block | 1 |