HIOKI
HIOKI 9666 Test Probe (100:1) for Memory HiCorders
HIOKI 9666 Test Probe (100:1) for Memory HiCorders

 

HIOKI 9666 Test Probe (100:1) for Memory HiCorders

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Product Details

Test Probe (100:1) for Memory HiCorders

  • 9666 Test Probe (100:1)
  • For Hioki Memory HiCorders with BNC inputs.
  • Input capacitance to the probe can be lowered to reduce the load effect

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