详情

Reference form measuring machine for the inspection and production environment with tactile and optical sensor

Features

The high-precision measuring machine MarForm MFU 110 is based on the proven MFU 100 and has been expanded with an ultraflexible optical measuring system. Now one tactile and one optical sensor are at your disposal for high-precision measuring tasks in the inspection laboratory and in the production environment.

All advantages of traditional tactile and modern optical metrology are united in this measuring machine. A summary of the advantages of optical metrology are given below:

Just like the MFU 100, an active air-conditioned cabin is optionally available for the MFU 110 for use in production environment. Shorter distances and faster intervention into the production process control reduce your costs and optimize the quality of your products.

A high degree of automation is achieved through the motorized centering and tilting table, which is a core component of Formtesters, and the use of the motorized T7W probe.

Due to the separation of machine control and profile evaluation, the MarForm MFU 110 is easily expandable and ready for the future. The addition of other languages or special evaluations is possible, as well as the implementation of new standards.

Application
Evaluation of of roundness, radial run-out, axial run-out, concentricity, coaxility, total run-out, total axial run-out, cylindricity, straightness, parallelism, perpendicularity, angularity, flatness, conicity, line form, position (DIN ISO 1101), cone form, diameter.

Measuring Station Components

FORM MEASURING MACHINE MarForm MFU 110


Technical Data
Roundness deviation (µm+µm/mm measuring height)
0,01 + 0,0002
Roundness deviation (µm+µm/mm measuring height)
0,02 + 0,0004
Axial runout deviation (µm+µm/mm measuring radius)
0,02 + 0,0002
Axial runout deviation (µm+µm/mm measuring radius)
0,04 + 0,0004
Centering and tilting table
automatic
Table diameter (mm)
180
Table load capacity, centered (N)
200
Speed (rpm) 50 Hz / 60 Hz
0.1 to 200
Straightness deviation / 100 mm measuring path (µm), Z axis
0.1
Straightness deviation / total measuring path (µm), Z axis
0.3
Parallelism deviation Z-/C axis in tracing direction, measuring path (µm)
0.6
Measuring speed (mm/s), Z axis
0.1 to 50
Positioning speed (mm/s), Z axis
0.1 to 50
Straightness deviation / total measuring path (µm), X axis
0.3
Perpendicularity X/C axis, measuring path (µm)
0.3
Positioning speed (mm/s), X axis
0.1 to 50
Measuring speed (mm/s), X axis
0.01 to 50

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