Mahr Metrology - WM 100: 马来西亚的首选 Obsnap Instruments Sdn Bhd

Mahr Metrology - WM 100

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详情

3D Measurement System with with light interferometer

Non-Contact - Easy to Use
Fast Roughness Measurement
Sub-nanometer - High Resolution

Features

Microscopic technology dedicated to the reproduction of tiny surface features up to the physical limit.
Video real time surface scanning technology for fast and reliable results.
Robust, maintenance free, long-lived construction.
Complete assortment of premium quality objectives available

Description
Surface scanning sensor ideally suited for fast-paced measurement of smallest to medium sized surface details, like roughness measurement in sub-nanometers. Excellent, high resolution reproduction of
even microscopic surface details.

Technical Data

Measuring principle	By interferometer, by white light interferometer Light source (WLI): LED, 505 nm
Measuring range mm	Sensor unit can be moved manually over 200 mm in Z Object table can be moved manually in X and Y Interferometer, white light interferometer: Measuring range (WLI): Up to 100 µm (vertical). More on request.
Interfaces	230 V, 50 Hz

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