Motic PA80/120Met The Large Stage Inspection Microscope

Description

Motic Scientific’s PA80MET and PA120MET series microscopes feature a flexible, modular design that can be suited to your specific industrial inspection application. Our Plan S-APO series objectives and professional optical system design ensure excellent optical performance, while our frame and base design creates a low gravity, high stability system which reduces vibration commonly experienced during higher magnification observation in industrial environments. Our PA80MET and PA120MET series microscopes are widely used for FPD, LCD, and silicon wafer inspection.

 
 
Highlights:

• German Designed 8-inch and 12-inch Stages
• Motorized Revolving Nosepiece
• Motic Analysis with sCMOS high performance Imaging
• Alternative Illumination
• Suitable for Electronic, Wafer, Harddisk and etc.
• 3D imaging capability.