JewelBox 70T & 90T

Kategori: Electronic and Semiconductor Inspection Tersedia
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Penerangan

Examine internal solder joints and bonds in advanced technology packages — BGAs,μBGAs, flip-chips, ICs and other complex components — that cannot be verified by visual inspection. At the same time, obtain precise images from soft materials — molded plastics and encapsulants — as easily as from denser materials.

 
For laboratory and failure analysis applications, JewelBox systems deliver superior image quality with excellent resolution and sensitivity. On the production line, JewelBox systems support fast, precise inspection of components and assemblies.
 
Specification 90T
JewelBox-90T Specifications
 
Specification 70T
JewelBox-70T Specifications

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Anires Tech Sdn Bhd
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