Product Details
High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.
The Keysight B2200A fA leakage switch mainframe reduces the cost of test by enabling automatic characterization tests without compromising the measurement performance of the semiconductor parameter analyzer. It supports a four source measurment unit with a Kelvin configuration and a capacitance meter — leaving you room for future expansion.
