Line Beam Mapping Sensors
The BWML series line beam mapping sensors are optimized for glass substrate detection by using location image mapping method to minimize non-detection area and influence from harsh external conditions. The sensors support CC-Link and EtherCAT communication protocols and feature channel editing function which allows users to change pixels or edit sensing channel area with a connected PC. IP67 protection structure allows stable and error-free operation even in wet or dusty environments. The line beam mapping sensors can be used to detect display panels on transport cassettes.
Main features
* Korea Patent Registration 10-1701419, Taiwan Patent Registration I657700, Japan Patent Registration 6553685, China Patent Registration ZL201710647015.0, China Patent Application 202010521657.8
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