Helps reduce adverse operator influence by ensuring the probe is placed perpendicular to the part’s surface in a controlled, repeatable way.
While intended primarily for the straight (0 degree) ferrous or nonferrous microprobes, this stand also accommodates our regular separate PosiTector 6000 FS, FXS, NS, FNS, FTS, FNDS, NAS probes.
For use with the PosiTector 6000