Available Probes: Portable Rockwell Probe 50N (can also be connected directly to PC)
Combination With Other Methods: Leeb, UCI
Average Roughness Ra (µm / µinch): 2/80
Minimum Mass (kg / lbs): No requirement
Minimum Thickness (mm / inch): 10 x indentation depth
Instrument Firmware
Automatic compensation for impact direction
Personalized user profiles and views
Integration in automated testing environments (incl. remote control)
11 Languages and timezones
Measurement wizards
Custom curve wizard
Combined method wizard
User guidance features
Custom report features
One-step calibration
metric and imperial units support
Display: 7” color rugged touchscreen unit (800 x 480 pixels) with dual core processor
Extremely precise, and material independent version of conventional Rockwell method
Resolution & depth
The only portable measurement method that has practically no minimal thickness limitation - perfect for thin sheets of metals, any material.
Versatility
Equally reliable, accurate and standardized but faster than stationary Rockwell hardness testers.
User Experience
Material independent method - that can be combined with Leeb and UCI in one measurement device. One device - all applications.
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