Description
Product Details
High-performance switching matrix, located between the semiconductor parameter analyzer and the wafer, reduces cost of test through characterization test automation.
The Keysight B2201A low leakage mainframe reduces the cost of test by enabling automated characterization tests. It supports a four-SMU, full-Kelvin configuration, and a capacitance meter, with room for future expansion. The B2201A low leakage mainframe has14 unique internal path measurement inputs and a distinctive capacitance measurement compensation feature for two of the inputs. The front panel gives you control via the keypad or optional light pen.
Features
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Lit display of relay status for fast verification and debug of measurement setups.
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Keysight EasyEXPERT software controls and automates switch settings via an intuitive GUI.
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Flexible CV inputs with integrated Keysight EasyEXPERT software capacitance compensation.
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Modular design supports 12, 24, 36, and 48 triaxial output configurations.
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Compatible with Keysight B2220A low leakage probe card interface.
Measurement Capabilities
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Ten femtoamp measurement resolution through the switch using the Keysight 4156C, B1500A, or E5270B HRSMU.
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Transient current settling time to < 300 fA; less than 2 seconds with 10 V input step.
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30 MHz bandwidth at -3dB.
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Channel isolation of 50 teraohms for low-current triaxial paths.
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