Description
Product Details
Sensor plate for nanoVTEP application, 4mm x 6.65mm, suitable for testing tantalum chip size C/D
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Max node count: 2592
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Max channel count: 576
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Footprint: 0.95m x 0.94m / 3.13’ x 3.08’
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Max no. of modules: 2
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
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Improved test efficiency with up to 4x faster Boundary Scan, Silicon Nails, and dynamic flash programming.
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100% backwards compatibility guarantees minimal downtime for installation and complete code compatibility.
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Certified M2M capabilities such as IPC-CFX and Hermes offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.
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Opportunity to save energy costs with a smart power supply, which intelligently monitors power consumption and reports energy savings.
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Industry leading support with Keysight On-site Now! Get quick, secure, hands-free help from the experts in record time.
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Modern software licensing demystifies license costs, centralizes license management, and scales to meet production demand.
Key Features & Specifications
Quantity of 20, 4mm x 6.65mm Sensor Plate
SMD Snap-fit socket
No soldering required
More detail about MOBICON-REMOTE ELECTRONIC SDN BHD
