Deskripsyon
Axiom, based on X-ray fluorescence(XRF), is the user friendly bench top instruments designed for material analysis and coating thickness measurements. The Xray source and detector assembly is located in the instruments’ upper chamber with motorizes Z axis movement which ensures the ease of measurement. The integrated video microscope with zoom and crosshair simplifies sample placement and allows for a precise measuring spot adjustment. The entire operation and evaluation as well as clear presentation of measurement data is performed on PC using simple and very user friendly interface on Software.
Description
Axiom is XRF are the user friendly benchtop instruments designed for material analysis and coating thickness measurements. The Xray source and detector assembly is located in the instrument’s upper chamber with motorizes Z axis movement which ensures the ease of measurement. The integrated video microscope with zoom and crosshair simplifies samples placement and allows for a precise measuring spot adjustment.
The instruments are perfectly designed to cater to material analysis and coating thickness measurement of multiple layers in application as follows :
Electronic and Electrical components jewelry Fastness PCB Liquid Analysis Hardware Connectors
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