Deskripsyon
High energy photons emitted by a X-ray tube interact with metal & materials. The high energy photon is absorbed by an electron of the atom. This electron is accelerated and forced to leave the atom. The so created hole in the structure of the electron shell is filled up by an electron of higher energy. The difference is energy between the leaving electrons position and the filling up electron may leave the atom as a photon of defined energy or as an electron.
In the case of a leaving photon this process is called X-ray fluorescent and the energy of the leaving photon is characteristic for this atom therefore for the element.
The electron shells of an atom are called K-, L-, M-shell. Filling up a hole in the K-shell creates, K-radiation (Ka if the filling up electron has is origin in the L-shell, Ka if the filling up electron has is origin in the M-shell). Filling up a hole in the L-shell creates L-radiation and so on. Only K and L radiation is on interest because the energy of K and L radiation is in the region which can be detected with standard detectors.
Technology Proportional Counter Detector (Prop counter) Based on gas filled prop counter for measuring most common alloys including gold for jewellery industry.
It has distinct advantages like high efficiency, wide bandwidth larger area where it can be scaled to almost all arbitarily large sizes.
Silicon Detector (Si-PIN) Based on high resolution Si-PIN is used for alloys analyzing in jewellery industry including gold & silver, even one step ahead for accuracy & repeatability compare to Gas filled pro counter.
Si-PIN with the usage of a high resolution silicon detector in conjunction digital signal processing achieves best detection limits and highest precision. Based on that, an about four times better resolution (in comparison with conventional technique) the element separation is much better. Furthermore lowest detection limits are achieved because of better signal to noise ratio. The Si-PIN is available with a larger active area and thicker depletion depth. Where resolution is not critical but high detection efficiency is important, the-Si-PIN is the best choice.
Silicon Drift Detector (SDD) Based on high resolution SDD which is ultimate for alloys analysing industry, its high resolution helps better repeatability and accuracy of measurement.
SDD has better energy resolution than a Si-PIN of the same area. The SDD has much better energy resolution at short peaking times, which is particularly helpful at high count rates. At the noise corner (the peaking time where the noise is minimal) the SDD’s resolution is still better. So where the highest resolution is needed, or where good resolution is needed at high count rates, the SDD is the best choice.
Measurement performance features Automatic application, recognition. Application & standards library. Numerical filtering package with peak deconvolution. Chamber performance capability Compact Sample Chamber accommodates a wide variety of parts.
Ease This machine is very user friendly and easy to operate. It doesn’t require any special person to operate. Simply position the piece of interest with the aid of a video microscope and start the measurement. The analysis is performed noncontact and non-destructive within 35 sec. to 3 minutes.
Coating Thickness Specially useful for plating & electronic industry.
Compact It is very Small in size, thanks to smart design which enables this machine fit at any place from smallest showroom to busy business area.
Fast Ultra fast detection system for quick results where the analysis performed is quick within 60 seconds.
Accurate This system is based on X-ray fluorescence radiation technology with modern user friendly software which ensures accurate measurements.
Non Destructive The analysis performed is non-contact and non-destructive. It also gives you measurement of other sub alloy apart from main alloy.
Major benefits of XRF with StaRk Series versatile testing equipments, potentially solving multiple testing needs with one analyzer. low initial costs compared to other analytical equipment. minimum operation costs non-destructive solutions minimal sample preparation instant results 60 to 300 sec. relatively simple technology to learn& obtain accurate, repeatable results. maximum profits through accuracy increase turn around and production output In-house quality control
Specification
Features of XMasteR Application
X-MasteR is the user-friendly operating software for the modern suit of X-ray systems. This program used most modern software tools available for Windows® operating platforms. The main task of the operating software is the control of all system parameters such as high voltage settings, X-ray tube current, display of collimators and filters as well as the collection and manipulation of the measurement data.
Capability
Empirical calibration mode for calibrating unit using well assessed standard samples. Fundamental calibration mode for standard free calibrations. Simultaneous quantitative measurement up to 8 elements. Qualitative material identification upto 20 elements. Spectrum analysis for semi-quantitative concentration measurement. Statistical functions with mean value, standard deviation, high/low reading, trend line etc. Application
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