KEYSIGHT NX5402A Silicon Photonics Wafer Test System

KEYSIGHT NX5402A Silicon Photonics Wafer Test System

Kategorya: Application-Specific Test Systems And Components Magagamit
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Deskripsyon

Product Details

NX5402A Silicon Photonics Wafer Test System is a solution of Keysight NX5400 Silicon Photonics Test Solution Series. It provides all required features for volume production testing such as Wafer Acceptance Testing (WAT) or Process Control Monitoring (PCM) with a fully automated wafer prober for volume production.

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