Mahr Metrology - MarSurf XR 1: Pinakamahusay na Pilihan sa Malaysia, Selangor, Kuala Lumpur (KL) Obsnap Instruments Sdn Bhd

Deskripsyon

MarSurf XR 1. The ideal instrument for a low-cost introduction to user-friendly surface metrology.
The PC-based instrument delivers all common surface parameters and profiles in accordance with international standards, both in the measuring room and in production. MarSurf XR 1 from Mahr stands for innovative roughness evaluation software.

Over 80 surface parameters for R-, P- and W-profiles according to current ISO/JIS or MOTIF standards (ISO 12085)
Bandpass filter Ls in accordance with current standard; Ls can also be switched off or varied as required
Comprehensive measuring records
Teach-in methods for the rapid creation of Quick&Easy measuring programs
Automatic functions for choosing cut-off and traversing length in accordance with standards
Support for various calibration methods (static and dynamic) by specifying the Ra or Rz parameter
Adjustable maintenance and calibration intervals
Multiple measuring station configurations for custom applications
Range of options provide system flexibility
Various user levels protect the device against misuse and prevent unauthorized people from using it

Technical Data

Measuring principle	Stylus method
Probe	BFW skidless system with MarSurf SD 26 drive unit and/or PHT skidded system with MarSurf RD 18 drive unit
Measuring range mm	+/- 250 µm (up to +/- 750 µm with 3x probe arm length) applies to BFW system 350 µm applies to PHT probe system
Filter according to ISO/JIS	filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
Traversing lengths	MarSurf GD 26 / SD 26: Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm, Measurement up to stop, variable Traversing length dependent on drive unit RD 18: Automatic; 1.75 mm; 5.6 mm; 17.5 mm
Number n of sampling length according to ISO/JIS	1 to 50 (default: 5)
Measuring force (N)	0,75 mN
Surface parameters	Over 80 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

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