Mahr Metrology - MFU 110 mit IPS: Pinakamahusay na Pilihan sa Malaysia, Selangor, Kuala Lumpur (KL) Obsnap Instruments Sdn Bhd

Deskripsyon

Reference form measuring machine for the inspection and production environment with tactile and optical sensor

Uses the advantages of the most modern optical measuring technology
Non-contact measurement on sensitive pieces
High measuring accuracy
Low production costs
Usable directly in the production environment
Maximum amount of automation

Features

The high-precision measuring machine MarForm MFU 110 is based on the proven MFU 100 and has been expanded with an ultraflexible optical measuring system. Now one tactile and one optical sensor are at your disposal for high-precision measuring tasks in the inspection laboratory and in the production environment.

All advantages of traditional tactile and modern optical metrology are united in this measuring machine. A summary of the advantages of optical metrology are given below:

No influence of measuring force: no bending or deformation of measuring objects
Non-contact measurement: no scratching or damage of sensitive surfaces
Direct measurement: no influence of ball tip geometry, therefore more exact recording of contours, e.g. edges, convex shapes
Very smal probe arm diameter: measuring of very small objects and shapes, e.g. small bores
High rotating speed of the C-axis: less measuring time, more data, laminary measuring
High vertical and lateral resolution: more precise measuring of diameter and distance
2 optical outputs: more flexible contacting, less turning of probe arm, improved cone measuring
Maximum measuring certainty
Process accuracy
Software package MarWin
Future proof

Just like the MFU 100, an active air-conditioned cabin is optionally available for the MFU 110 for use in production environment. Shorter distances and faster intervention into the production process control reduce your costs and optimize the quality of your products.

A high degree of automation is achieved through the motorized centering and tilting table, which is a core component of Formtesters, and the use of the motorized T7W probe.

Due to the separation of machine control and profile evaluation, the MarForm MFU 110 is easily expandable and ready for the future. The addition of other languages or special evaluations is possible, as well as the implementation of new standards.

Application
Evaluation of of roundness, radial run-out, axial run-out, concentricity, coaxility, total run-out, total axial run-out, cylindricity, straightness, parallelism, perpendicularity, angularity, flatness, conicity, line form, position (DIN ISO 1101), cone form, diameter.

Compact measuring volume, loading capacity up to 200 N
Inspection of 'true parallelism' when the horizontal X-axis passes the workpiece center, results free from other measuring influences
Optimal for a higher tolerance latitude in the production environment
Fast Roundness measurement with up to 200 rpm

Measuring Station Components

FORM MEASURING MACHINE MarForm MFU 110

High-precision Formtester MFU 110 with optical sensor
and high speed C-axis
Evaluation computer Marwin
Integrated modem
PC hardware in compliance with the Mahr standard available at the time of delivery
Windows-based operating system (Windows 7 Ultimate 64 bit)
Software package 'Mahr Form - and Location Evaluation'
Work table with integrated control unit
T7W probe: motorized bi-directional length measuring probe, incl. standard probe arm with sperical stylus, dia. 3 mm
Optical measuring probe IPS or WP (Details on request)

Technical Data

Roundness deviation (µm+µm/mm measuring height)	0,01 + 0,0002
Roundness deviation (µm+µm/mm measuring height)	0,02 + 0,0004
Axial runout deviation (µm+µm/mm measuring radius)	0,02 + 0,0002
Axial runout deviation (µm+µm/mm measuring radius)	0,04 + 0,0004
Centering and tilting table	automatic
Table diameter (mm)	180
Table load capacity, centered (N)	200
Speed (rpm) 50 Hz / 60 Hz	0.1 to 200
Straightness deviation / 100 mm measuring path (µm), Z axis	0.1
Straightness deviation / total measuring path (µm), Z axis	0.3
Parallelism deviation Z-/C axis in tracing direction, measuring path (µm)	0.6
Measuring speed (mm/s), Z axis	0.1 to 50
Positioning speed (mm/s), Z axis	0.1 to 50
Straightness deviation / total measuring path (µm), X axis	0.3
Perpendicularity X/C axis, measuring path (µm)	0.3
Positioning speed (mm/s), X axis	0.1 to 50
Measuring speed (mm/s), X axis	0.01 to 50

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