P28N60M2 STP28N60M2

P28N60M2 STP28N60M2

Category: Available (Qty:9999999)
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Description

BUY P28N60M2 STP28N60M2 https://www.utsource.net/itm/p/11665084.html

Parameter Symbol Min Typ Max Unit Conditions
Drain-Source Voltage VDSS - 600 - V
Gate-Source Voltage VGSS -20 - 15 V
Continuous Drain Current (TC = 25掳C) ID - 28 - A
Continuous Drain Current (TC = 100掳C) ID - 17.5 - A
Pulse Drain Current (TC = 25掳C, tp = 10 ms, Duty Cycle = 1%) ID(p) - 130 - A
Gate Charge QG - 95 - nC
Input Capacitance Ciss - 4400 - pF VGS = 15V, f = 1 MHz
Output Capacitance Coss - 1250 - pF VDS = 400V, f = 1 MHz
Reverse Transfer Capacitance Crss - 650 - pF VDS = 400V, f = 1 MHz
Total Gate Charge QG - 95 - nC VGS = 15V, VDS = 400V, ID = 28A
Turn-On Delay Time tdon - 30 - ns VGS = 15V, ID = 28A, Rg = 3.3惟
Rise Time tr - 35 - ns VGS = 15V, ID = 28A, Rg = 3.3惟
Turn-Off Delay Time tdo - 40 - ns VGS = 15V, ID = 28A, Rg = 3.3惟
Fall Time tf - 50 - ns VGS = 15V, ID = 28A, Rg = 3.3惟
Power Dissipation (TC = 25掳C) PD - 250 - W
Junction to Case Thermal Resistance R胃JC - 0.6 - 掳C/W
Junction to Ambient Thermal Resistance R胃JA - 40 - 掳C/W
Storage Temperature Range Tstg -55 - 150 掳C
Operating Junction Temperature TJ -55 - 150 掳C

Instructions for Use:

  1. Power Supply and Heat Sinking:

    • Ensure that the power supply voltage does not exceed the maximum drain-source voltage (VDSS).
    • Use appropriate heat sinking to keep the junction temperature within the operating range (TJ).
  2. Gate Drive:

    • Apply the gate-source voltage (VGSS) within the specified limits to avoid damage.
    • Use a gate resistor (Rg) to control the switching speed and reduce EMI.
  3. Current Handling:

    • Do not exceed the continuous drain current (ID) ratings at the specified case temperatures.
    • For pulse applications, ensure that the pulse duration and duty cycle do not exceed the specified limits.
  4. Capacitance and Charge:

    • Account for the input capacitance (Ciss), output capacitance (Coss), and reverse transfer capacitance (Crss) when designing the circuit.
    • The total gate charge (QG) affects the switching losses; ensure that the gate drive circuit can handle this charge efficiently.
  5. Thermal Management:

    • Monitor the thermal resistance (R胃JC and R胃JA) to ensure proper heat dissipation.
    • Use thermal vias and heatsinks to maintain the device within its safe operating area.
  6. Storage and Handling:

    • Store the device in a dry environment and handle with care to prevent electrostatic discharge (ESD) damage.
    • Follow the recommended storage temperature range (Tstg) to avoid degradation.
  7. Testing and Validation:

    • Perform thorough testing under all expected operating conditions to validate the performance and reliability of the device in your application.
(For reference only)

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