Description
BUY IRFI4212H https://www.utsource.net/itm/p/12608477.html
Parameter |
Symbol |
Min |
Typ |
Max |
Unit |
Conditions |
Drain-Source Voltage |
VDS |
- |
200 |
- |
V |
|
Gate-Source Voltage |
VGS |
-15 |
0 |
15 |
V |
|
Continuous Drain Current |
ID |
- |
3.9 |
- |
A |
@ TC = 25°C, VGS = 10V |
Pulse Drain Current |
IDpeak |
- |
46 |
- |
A |
tp = 10 μs, Duty Cycle = 1% |
Total Power Dissipation |
PD |
- |
87 |
- |
W |
@ TC = 25°C |
Junction Temperature |
Tj |
- |
- |
175 |
°C |
|
Storage Temperature |
Tstg |
-55 |
- |
150 |
°C |
|
Instructions for IRFI4212H:
Handling and Storage:
- Ensure that the device is stored within the specified storage temperature range to avoid damage.
- Handle with care to prevent electrostatic discharge (ESD) which can damage the MOSFET.
Mounting:
- Mount the device in a way that allows for proper heat dissipation to maintain junction temperature within limits.
- Use appropriate mounting hardware and thermal interface materials to ensure good thermal conductivity.
Biasing:
- Apply gate-source voltage (VGS) within the specified limits to prevent gate oxide breakdown.
- Ensure that the drain-source voltage (VDS) does not exceed the maximum rating to avoid damaging the device.
Operation:
- Operate the device within the continuous drain current (ID) limits at the specified case temperature.
- For pulse applications, adhere to the pulse drain current (IDpeak) specifications including pulse width and duty cycle.
Testing:
- When testing or evaluating the device, follow the conditions specified in the parameter table to obtain accurate results.
Safety:
- Always refer to the data sheet for detailed safety and operational guidelines specific to this MOSFET model.
(For reference only)
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