A3P250-VQ100I

A3P250-VQ100I

Category: Available (Qty:9999999)
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Description

BUY A3P250-VQ100I https://www.utsource.net/itm/p/12609305.html

Parameter Description
Package Type VQ100I
Operating Voltage 2.5V to 5.5V
Operating Temperature -40°C to +85°C
Storage Temperature -65°C to +150°C
I/O Structure 3.3V CMOS/TTL Compatible
Power Consumption Low power consumption for extended battery life
Configuration Memory Non-volatile memory for configuration storage
I/O Banks 14 banks of I/O pins
Clock Management Integrated PLL for clock synthesis and distribution
JTAG Interface IEEE 1149.1 compliant for boundary-scan testing
Configuration Interface SPI, JTAG, AS, and USB options

Instructions for A3P250-VQ100I

  1. Power Supply Connections:

    • Ensure the power supply voltage is within the specified range (2.5V to 5.5V).
    • Connect the appropriate decoupling capacitors close to the power supply pins.
  2. Configuration:

    • Use the SPI, JTAG, AS, or USB interface to configure the device.
    • Load the configuration data into the non-volatile memory before operation.
  3. Clock Setup:

    • Configure the internal PLL if required for generating higher frequency clocks.
    • Connect external oscillators as needed according to the application requirements.
  4. I/O Pin Handling:

    • Set up the I/O banks according to the specific needs of your application.
    • Ensure all unused I/O pins are tied to a defined state (either GND or VCC).
  5. Testing and Debugging:

    • Utilize the JTAG interface for debugging and testing purposes.
    • Follow the IEEE 1149.1 standard for boundary-scan testing procedures.
  6. Environmental Considerations:

    • Operate the device within the specified temperature ranges to ensure reliability.
    • Store the device in environments that do not exceed the storage temperature limits.
  7. Handling Precautions:

    • Handle the device with care to avoid ESD damage.
    • Follow anti-static precautions during handling and installation.
(For reference only)

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