Description
BUY IDT70261S15PF https://www.utsource.net/itm/p/12611378.html
Parameter |
Description |
Value |
Unit |
Device Type |
High-Speed CMOS Synchronous SRAM |
IDT70261S15PF |
|
Organization |
x18 |
|
|
Density |
2M x 18 |
36 Mbit |
|
Supply Voltage (Vcc) |
Operating Voltage |
3.3 |
V |
Standby Current |
Power Supply Current in Standby Mode |
5 |
mA |
Active Current |
Power Supply Current in Active Mode |
70 |
mA |
Access Time |
Random Access Time |
10 |
ns |
Cycle Time |
Minimum Cycle Time |
10 |
ns |
Output Drive Capability |
Output Drive |
24mA |
mA |
Package Type |
Plastic Fine Pitch Ball Grid Array (BGA) |
196-Ball BGA |
|
Operating Temperature |
Industrial Temperature Range |
-40 to +85 |
°C |
Storage Temperature |
Storage Temperature Range |
-65 to +150 |
°C |
Instructions for Use
Power Supply Connection:
- Connect the Vcc pin to a 3.3V power supply.
- Ensure proper decoupling capacitors are placed close to the power supply pins to minimize noise.
Signal Integrity:
- Keep signal traces as short as possible to reduce propagation delays and reflections.
- Use controlled impedance traces for high-speed signals.
Clock and Control Signals:
- The device is synchronous; ensure the clock signal is stable and clean.
- All control signals should be synchronized with the clock.
Initialization:
- After applying power, allow sufficient time for the device to stabilize before initiating any read/write operations.
Read/Write Operations:
- For write operations, present the data on the data bus and assert the write enable (WE) signal along with the chip select (CS).
- For read operations, assert the chip select (CS) and provide the address. Data will be available on the data bus after the access time.
Standby Mode:
- To enter standby mode, deassert the chip select (CS). This reduces power consumption significantly.
Handling Precautions:
- Handle the device with care to avoid damage from electrostatic discharge (ESD).
- Follow recommended guidelines for soldering and PCB layout.
Testing and Verification:
- Verify all connections and configurations using appropriate test equipment.
- Perform functional tests to ensure the device operates within specified parameters.
For detailed specifications and further instructions, refer to the official datasheet provided by Integrated Device Technology (IDT).
(For reference only)
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