SGH80N60UFDTU

SGH80N60UFDTU

Category: Available (Qty:9999999)
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Description

BUY SGH80N60UFDTU https://www.utsource.net/itm/p/12612167.html

Parameter Symbol Min Typ Max Unit Description
Drain-Source Voltage VDSS - 600 - V Maximum drain-to-source voltage
Gate-Source Voltage VGS -20 - 20 V Maximum gate-to-source voltage
Continuous Drain Current ID - 8.0 - A Continuous drain current at TC = 25°C
Pulse Drain Current IDM - 40 - A Pulse drain current (t < 10 μs)
Power Dissipation PD - 150 - W Total power dissipation at TC = 25°C
Junction Temperature Tj -55 - 175 °C Operating junction temperature range
Storage Temperature Tstg -55 - 175 °C Operating storage temperature range

Instructions for Use:

  1. Installation:

    • Ensure that the SGH80N60UFDTU is handled with care to avoid damage to the leads and body.
    • Follow proper mounting techniques to ensure good thermal contact and mechanical stability.
  2. Thermal Considerations:

    • For applications requiring high power dissipation, use an appropriate heat sink to maintain the junction temperature within specified limits.
  3. Electrical Connections:

    • Connect the drain terminal to the high-voltage side of the circuit.
    • Connect the source terminal to the low-voltage side or ground.
    • Apply control signals to the gate terminal ensuring they do not exceed the maximum ratings.
  4. Gate Drive Requirements:

    • The gate drive voltage should be within the specified range to prevent damage and ensure reliable operation.
    • Ensure the gate resistor is chosen to limit inrush currents and provide stable switching.
  5. Overcurrent Protection:

    • Implement overcurrent protection circuits to safeguard against excessive drain currents which can lead to device failure.
  6. Handling Precautions:

    • Be aware of electrostatic discharge (ESD) sensitivity and use ESD protective measures when handling the component.
    • Avoid exposing the device to environments exceeding the storage temperature range.
  7. Testing:

    • Before final installation, test the device under controlled conditions to ensure it meets the required specifications and performance criteria.
(For reference only)

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