Mahr Metrology - MarForm MFU 110 Reference Formtester: Pilihan Utama di Malaysia, Selangor, Kuala Lumpur (KL) Obsnap Instruments Sdn Bhd

Penerangan

Reference form measuring machine for the precision measuring room and production with tactile and optical probe.

Use of the benefits of the most modern, optical metrology
Non-tacticle optical form measurement of sensitive parts
Particularly high measuring accuracy
Lowers your production costs
For use directly in production
Highest degree of automation

The high-precision MarForm MFU 110 measuring machine is based on the tried and tested MFU 100 with the addition of a high-speed C-axis. The highly flexible MarVision IPS 15 optical measuring system is optionally available. It is a tactile and optical probe for high-precision measuring tasks in measuring rooms or in production.

Technical Data

Roundness deviation (µm+µm/mm measuring height)	0,01 + 0,0002
Roundness deviation (µm+µm/mm measuring height)	0,02 + 0,0004
Axial runout deviation (µm+µm/mm measuring radius)	0,02 + 0,0002
Axial runout deviation (µm+µm/mm measuring radius)	0,04 + 0,0004
Centering and tilting table	automatic
Table diameter (mm)	180
Table load capacity, centered (N)	200
Speed (rpm) 50 Hz / 60 Hz	0.1 to 200
Straightness deviation / 100 mm measuring path (µm), Z axis	0.1
Straightness deviation / total measuring path (µm), Z axis	0.3
Parallelism deviation Z-/C axis in tracing direction, measuring path (µm)	0.6
Measuring speed (mm/s), Z axis	0.1 to 50
Positioning speed (mm/s), Z axis	0.1 to 50
Straightness deviation / total measuring path (µm), X axis	0.3
Perpendicularity X/C axis, measuring path (µm)	0.3
Positioning speed (mm/s), X axis	0.1 to 50
Measuring speed (mm/s), X axis	0.01 to 50

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