Product Details
With a smaller physical profile, nanoVTEP enables greater opportunity for vectorless test implementation on high density boards when fixture clearance is a premium. The amplifier is placed ideally above the device under test, providing a shorter signal path for better signal measurement with less distortion.
Your production line demands high throughput. Throughput requires test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides just that. Built upon a proven technology foundation, the Series 6 family ICT system improves test efficiency compared to previous offerings. With time-tested software, hardware, and programmability the Series 6 are fully backwards compatible with previous systems and make highly repeatable measurements.
Key Features & Specifications
Quantity of 100 nanoVTEP probes
Comes with amplifier, barrel, spring clip and receptacle
Suitable for testing devices that are 10mm or smaller
Increased test coverage and fault detection with miniaturized test probe that overcome placement challenges in high density fixtures
