No contact, no contamination, no damage to the sample
Non-contact spectrophotometer is a high-precision color measuring instrument, which can quickly and accurately measure the color of the surface of the object through a non-contact way, without pollution or damage to the sample; It can also be installed on the assembly line and mechanical arm to monitor the color of the product in real time, return the data, and provide timely feedback on the quality of the product.
Double light path spectrophotometric method for color measurement, fast speed, high precision, good repeatability
Can measure multiple indicators: color reflectance, CIE Lab, LCh, Luv, XYZ, Yxy, Hunter - Lab, etc., as shown in the parameter
Waterproof and dustproof, protection gradeIP66
Support RS232, RS485, USB, network port, analog signal multiple communication modes
Use LED light source, longer service life
Internal calibration is supported to ensure high stability of the instrument
Comes standard with powerful PC data management software
| Model | CRX-60 | CRX-62 | CRX-66 |
| Appearance and colour | Black | Silver | Silver |
| Screen | No | Yse | Yes |
| Repeatability | dE*ab≤0.1 | dE*ab≤0.05 | dE*ab≤0.02 |
| Inter-instrument agreement | / | / | dE*ab≤0.25 |
| Measurement index | 2 kinds | 27kinds | 27kinds |
| Evaluating light sources | 3kinds | 37kinds | 37kinds |
| Model | CRX-60 | CRX-62 | CRX-66 |
| Geometry* | 45/0 | ||
| Repeatability** | dE*ab≤0.1 | dE*ab≤0.05 | dE*ab≤0.02 |
| Inter-instrument agreement*** | / | / | dE*ab≤0.25 |
| Display accuracy | 0.01 | ||
| Measuring/Lighting calibers | Φ8mm/Φ21mm | ||
| Measurement index | CIE-Lab,XYZ |
Light source condition,
CIE-Lab,CIE-LCh,HunterLab,CIE-Luv,XYZ,Yxy,RGB,chromatic aberration(ΔE*ab,ΔE*cmc,ΔE*94,ΔE*00),whiteness(ASTM E313-00,ASTM E313-73,CIE，ISO2470/R457,AATCC, Hunter,Taube Berger Stensby),yellowness(ASTM D1925, ASTM E313-00,ASTM E313-73),blackeness(My,dM), color fastness,color fastness,Tint(ASTM E313-00), color densityCMYK(A,T,E,M) |
|
| Light source condition | A,C,D65 |
A,B,C,D50,D55,D65,D75,F1,F2,F3,F4,F5,F6,F7,F8,
F9,F10,F11,F12,CWF,U30,U35,DLF,NBF,TL83,TL84,ID50,ID65,LED-B1,LED-B2,LED-B3,LED-B4,LED-B5, LED-BH1,LED-RGB1,LED-V1, LED-V2 |
|
| Lighting source | Full band balancedLED light source | ||
| Field angle | 2°，10° | ||
| Meet a criterion | CIE No.15,GB/T 3978,GB 2893,GB/T 18833,ISO7724-1,ASTM E1164,DIN5033 Teil7 | ||
| Spectroscopic method | Nanobeam splitting device | Raster | |
| SenSor | Silicon optical array device | Dual-row high-precisionCMOS array sensor | |
| Wavelength interval | 10nm | ||
| Wavelength coverage | 400-700nm | ||
| Reflectance measurement range | 0-200% | ||
| Reflectance resolution | 0.01% | ||
| Measurement and observation mode | Visual | ||
| Calibration | Intelligent automatic calibration | ||
| Accuracy guarantee | Ensure the first level of measurement | ||
| Measuring time | Single measurement 110ms | Single measurement50ms | |
| Measuring interval | 1s | ||
| Port | USB，485，232，External trigger, analog output, Ethernet | ||
| Screen | No | Full color screen，3.5 inches | |
| Light source lifetime | 1 million times in 10 years | ||
| Language | / | Simplified Chinese, English | |
| Non-contact distance | 5mm | ||
