Roughness and contour measurement at a measuring station with MarSurf XCR 20
The combined measuring station allows both surface roughness and
contour measurements to be performed at a single measuring station.
Depending on the measuring task, either the GD 25 drive unit for surface roughness measurements or the PCV drive unit for contour measurements can be activated.
Both measuring systems are fixed to the measuring stand by means of a combi holder.
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Resolution
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In Z, relative to stylus tip:
In Z, relative to measuring system: |
|---|---|
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Sampling angle
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On smooth surfaces, depending on deflection:
trailing edges up to 88°, leading edges up to 77° |
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Start of traversing length (in X)
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0.2 mm
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Tip radius
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25
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Contacting speed (in Z)
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0.1 to 1 mm/s
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Probe arm length
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175 mm, 350 mm
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End of traversing length (in X)
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200 mm
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Positioning speed
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In X and return speed: 0.2 to 8 mm/s
In Z: 0.2 to 10 mm/s |
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Guide deviation
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< 1 µm (over 200 mm)
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Measuring speed
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0.2 mm/s to 4 mm/s
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Measuring principle
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Stylus method
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Probe
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R probe, MFW 250
Optical probe Focodyn*, LS 1*, LS 10* (*only in conjunction with PGK or GD 120 CNC drive unit) |
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Measuring range mm
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(in Z) 50 mm
MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin) |
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Traversing lengths
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Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm,
(.022 / .070 / .224 / .700 / 2.240 in), Measurement up to stop, variable |
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Number n of sampling length according to ISO/JIS
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1 to 50 (default: 5)
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Measuring force (N)
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1 mN to 120 mN, below and above
(can be set in MarSurf XC 20) |
Malaysia
