Mahr Metrology - XR 20 MarWin MIT GD 120: Pilihan Utama di Malaysia, Selangor, Kuala Lumpur (KL) Obsnap Instruments Sdn Bhd

Penerangan

PC based instrument delivers all common surface parameters and profiles in accordance with international standards (both in measuring room and in production)

Combines decades of experience in surface metrology with innovative technology
- Easy to read icons
-User friendly operator assistance

A sampling length of up to 120 mm is possible in conjunction with the GD 120 drive unit

In addition to surface roughness evaluations, profile and waviness evaluations can also be performed in this way
Over 100 surface parameters available for R, P and W profiles in accordance with ISO / JIS, ASME or MOTIF (ISO 12085)
Tolerance monitoring and statistics for all surface parameters
Internal program assistance for quick and easy measurements
Comprehensive measuring records
Automatic functions for choosing filter and traversing length in accordance with international standards
Support for various calibration methods (static/dynamic) by specifying the Ra or Rz parameter
Adjustable maintenance and calibration intervals
Simulation mode for rapid familiarization with operating principle
Multiple measuring station configurations for custom applications

Technical Data

Measuring principle	Stylus method
Probe	R probe, MFW 250 B
Measuring range mm	MFW 250: ±25 µm, ±250 µm, (up to ±750 µm); ±1000 µin, ±10,000 µin (up to ±30,000 µin)
Filter according to ISO/JIS	filter as per ISO 16610-21(replaced gaussian filter as per ISO 11562), robust gaussian filter a per ISO 16610-31
Traversing lengths	Automatic; 0.56 mm; 1.75 mm; 5.6 mm; 17.5 mm, 56 mm, Measurement up to stop, variable Traversing length dependent on drive unit
Number n of sampling length according to ISO/JIS	1 to 50 (default: 5)
Surface parameters	Over 100 surface parameters for R, P and W profiles according to current ISO/JIS or MOTIF standards (ISO 12085)

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