Functions & Features:
| Model No. | Leeb250 | Leeb252 |
| Measuring principle | Fe | NFe |
| Measuring Range (μm) |
0~1250μm |
|
| Accuracy | ±(3%H+1)μm; H refers to the thickness of testing piece | |
| Min thickness of Substrate (mm) | 0.5 | |
| Minimum resolution (μm) | 0.1μm (0-99.9μm); 1μm (100-1250μm) | |
| Min curvature of the min area (mm) | Fe: Convex1.5 Concave25 / NFe: Convex3 Concave50 | |
| Temperature: |
0~40°C |
|
| Environment | No strong magnetic field | |
| Dimensions | 130*70*39 mm | |
| Net weight | 120g | |
| Power supply | 2*1.5 AAA battery | |
| Standard Configuration | Main machine, Calibration Specimens*5, FE/NFE Substrate, Users'Manual, Qualified Certificate, Packing list, Warranty Card | |
