Mô tả
Product Details
NX5402A Silicon Photonics Wafer Test System is a solution of Keysight NX5400 Silicon Photonics Test Solution Series. It provides all required features for volume production testing such as Wafer Acceptance Testing (WAT) or Process Control Monitoring (PCM) with a fully automated wafer prober for volume production.
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One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
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Automated one pass testing for complex and massive optical and electrical measurements
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Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
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High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
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Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
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Dedicated support model enabling high system availability for production
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Keysight-developed Fiber Alignment and Positioning System
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Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
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Reliable performance monitoring by Build-in Automatic System Diagnostics
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Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode
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