RAD-WIM 12 Series

Semiconductor Wafer Inspection Microscope

Equipped with varisized Wafer holders (Including 6/8/12 inches), RAD-WIM 8 and RAD-WIM 12 is professionally applied for wafer and flat panel display detection, maximally supports for dia 300mm of wafer and 17'' of FPD. More comfortable, flexible and quicker operation is available with upgraded ergonomics design.