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Over 100 companies had participated in the past 3 years
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More than 30 overseas Keysight division speakers were invited to share their measurement expertise and insights
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More than 5 latest market technologies discussed in last year KMF – 5G, 802.11p, USB Type-C, DDR4, PAM4 and more!
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More than 100 attendees participated in post-KMF webcast and more than 300 times presenter’s papers were downloaded.
This explain why this forum serves as a exciting platform for researchers and practitioners from both academia
and industry to meet and understand cutting-edge developments in the next tech mega-trend.
This year, we are catering 7 industry-specific booths for you to know and learn more about latest test and measurement solution:
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Education and Manufacturing
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Automotive and Energy
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Cellular, Iot and Wireless Connection
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Aerospace and Defence
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Digital and Photonics Solution
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Component Analysis
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Semiconductor Measurement
And of course, our technical and solution partners’ solution will be showcase too.
Venue |
Date |
Equatorial Hotel, Penang |
10th May 2015 |
Marriott Tang Plaza Hotel, Singapore |
13th May 2015 |
We promise you not only your day to be filled with valuable knowledge and technology updates,
but also excitement of winning following attractive lucky draw gifts!!
Time |
Agenda |
08:45 - 09:15 |
Welcome coffee/tea & Registration |
09:15 - 09:20 |
Opening Speech |
09:20 - 10:00 |
Keynote Speech |
10:00 - 10:30 |
Tea Break & Moving to Your Choice of Track |
|
Track A: RF Component and Wireless Testing |
Track B: High Speed Digital & Power Testing |
|
10:30 - 11:15 |
Paper 1
Evaluating Waveform Coexistence for 5G, Wireless and Radar Application |
Paper 1
Testing USB 3.1 Type-C and Understanding the Type-C Test Environment |
|
11:15 - 12:00 |
Paper 2
Be Low Power Wide Area Networks, NB-IoT and the Internet of Things |
Paper 2
Identify and Remove Crosstalk From Your High-speed Signals |
|
12:00 - 13:30 |
Lunch & Solution Booth Visit |
13:30 - 13:45 |
Product Buzz
How to Improve Emission Test System |
Product Buzz
Tips for Overcoming Probing Challenges |
|
13:45 - 14:30 |
Paper 3
Faster, Better and Cheaper Ways to Test Today's Wireless Devices |
Paper 3
Solving Signal and Power Integrity Design Challenges |
|
14:30 - 14:45 |
Product Buzz
Introducing New Generation of Signal Analyzer |
Product Buzz
N1090A DCA-M High Accuracy, Low Cost Solution for Optical Waveform Analysis |
|
14:45 - 15:30 |
Tea Break & Solution Booth Visit |
15:30 - 15:45 |
Product Buzz
Introducing TVAC Power Sensor |
Product Buzz
Introducing New Device Current Waveform Analyzer |
|
15:45 - 16:15 |
Paper 4
Simplifying RF Design Integration |
Paper 4
Innovate An Energy Efficient Design Through Measurements for Automotive Electronics and Power Conversion Devices |
|
16:15 - 16:45 |
Paper 5
Improving Throughput Using New Generation of Network Analyzer |
Paper 5
Modern Measurement Tools to Solve IoT Design Validation and Characterization Challenges |
|
16:45 - 17:00 |
Closing & Grand Lucky Draw |